Efficient Static Test Compaction Algorithms For Combinational Circuits Based On Test Relaxation
Author
Osais, Yahya Esmail .
Abstract
advances in the semi conductor proces and desine tecnology have paved the way for system on chibs
Extent
1 item
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Source URL:
https://kku.dar.medad.com/dar/efficient-static-test-compaction-algorithms-combinational-circuits-based-test-relaxation
